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dc.contributor.authorDunal, Rafał
dc.contributor.authorPiskorski, Michał
dc.contributor.authorKrukowski, Paweł
dc.contributor.authorKrempiński, Patryk
dc.date.accessioned2026-03-19T06:03:23Z
dc.date.available2026-03-19T06:03:23Z
dc.date.issued2025
dc.identifier.urihttp://hdl.handle.net/11089/57736
dc.descriptionThis dataset related to the paper https://doi.org/10.1021/acs.jpcc.5c04807 contains experimental results for two types of 2D material systems: MoO₃/mica and MoS₂/Au, prepared in the form of flakes with varying thicknesses, ranging from monolayer to few-layer structures. The dataset is divided into two independent subsets corresponding to each material system. Each subset includes: optical microscopy images of the investigated structures, atomic force microscopy (AFM) topography maps with calibrated lateral dimensions and height profiles, enabling thickness determination and morphology analysis, hyperspectral Raman data cubes acquired over a broad spectral (energy) range, extracted Raman spectra corresponding to selected regions of the flakes with well-defined thickness (different numbers of monolayers). The dataset enables comprehensive analysis of structural, morphological, and phonon-related properties of 2D materials as a function of layer number. It provides a basis for reliable identification of layer thickness, assessment of sample homogeneity, and correlation between Raman response and structural characteristics.pl_PL
dc.description.abstractThe data set contains source files that are in part the basis for analyzes presented in publication (https://doi.org/10.1021/acs.jpcc.5c04807) resulting from the implementation of project 2020/38/E/ST3/00293 (SONATA BIS). These data support studies on thickness-dependent properties of 2D materials and can be directly used in the context of resistive switching research, particularly for sample selection, structural characterization, and evaluation of defect-related inhomogeneities relevant to the possible formation and stability of conductive channels.pl_PL
dc.description.sponsorshipNational Science Centre, Poland project 2020/38/E/ST3/00293 (SONATA BIS)pl_PL
dc.rightsUznanie autorstwa 4.0 Międzynarodowe*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/*
dc.subjectRaman spectroscopypl_PL
dc.subjectAFMpl_PL
dc.subject2D MoO3pl_PL
dc.subject2D MoS2pl_PL
dc.titleAFM, Optical Microscopy, and Raman Spectroscopy Data for Thickness-Dependent Characterization of MoO3/Mica and MoS3/Au 2D Structures, 2020/38/E/ST3/00293, SONATA BIS (dataset)pl_PL
dc.typeDatasetpl_PL
dc.contributor.authorAffiliationUniversity of Lodzpl_PL
dc.disciplinenauki fizycznepl_PL


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  • Dane badawcze | Research Data [6]
    Dane badawcze zebrane w ramach projektów realizowanych na Wydziale Fizyki i Informatyki Stosowanej | Research data collected as part of projects carried out at the Faculty of Physics and Applied Informatics

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Uznanie autorstwa 4.0 Międzynarodowe
Except where otherwise noted, this item's license is described as Uznanie autorstwa 4.0 Międzynarodowe