AFM, Optical Microscopy, and Raman Spectroscopy Data for Thickness-Dependent Characterization of MoO3/Mica and MoS3/Au 2D Structures, 2020/38/E/ST3/00293, SONATA BIS (dataset)

Abstract

The data set contains source files that are in part the basis for analyzes presented in publication (https://doi.org/10.1021/acs.jpcc.5c04807) resulting from the implementation of project 2020/38/E/ST3/00293 (SONATA BIS). These data support studies on thickness-dependent properties of 2D materials and can be directly used in the context of resistive switching research, particularly for sample selection, structural characterization, and evaluation of defect-related inhomogeneities relevant to the possible formation and stability of conductive channels.